| 1. | Describing and specifying a wavelength - dispersive x - ray spectrometer
波长扩散x射线分光仪的描述和规定 |
| 2. | Wavelength dsperseve x - ray spectrometer x
射线波长析谱仪 |
| 3. | Verification regulation of activity standard device for ge - - ray spectrometer
锗谱仪活度标准装置检定规程 |
| 4. | X - ray spectrometer arrangement , x
射线分光装置 |
| 5. | Gamma ray spectrometer
射线能谱仪 |
| 6. | Verification regulation of calibration for ge - - ray spectrometer by eu point - ray standard source
用eu点状标准源校准锗谱仪检定规程 |
| 7. | Verification regulation of ge - - ray spectrometer for activity measurement device of voluminous source
锗谱仪体源活度测量装置检定规程 |
| 8. | Cryostat end - cap dimensions for germanium semiconductor detectors for gamma - ray spectrometers
锗半导体射线光谱分析仪用锗半导体探头晶体端.帽罩尺寸 |
| 9. | Microbeam analysis - instrumental specification for energy dispersive x - ray spectrometers with semiconductor detectors
微光束分析.带半导体探测器的能量散射x射线光谱仪的仪器规范 |
| 10. | Test method for energy dispersive x - ray spectrometer analysis of metallic surface condition for gas distribution system components
气体分配系统元部件用金属表面状态的能量分散x射线分光光谱分析试验法 |
